From: Digital staining in optical microscopy using deep learning - a review
Metric | Formal definition | DS References |
---|---|---|
Mean Absolute Error (MAE) | \(L_{MAE} = \sum _{x=1,y=1}^{X,Y}|O(x,y)-\hat{O}(x,y)|\) | |
Mean Squared Error (MSE) | \(L_{MSE} = \sum _{x=1,y=1}^{X,Y}(O(x,y)-\hat{O}(x,y))^2\) | |
Cross-entropy | \(L_{CE} = \sum _{x=1,y=1}^{X,Y}\hat{O}(x,y)log(O(x,y))\) | |
Structural Similarity Index Measure (SSIM) | \(L_{SSIM} = \frac{(2\mu _o\mu _{\hat{o}}+c_1)(2\sigma _o\sigma _{\hat{o}}+c_2)}{(\mu _o^2 + \mu _{\hat{o}}^2+c_1)(\sigma _o^2 + \sigma _{\hat{o}}^2+c_2)}\) |