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Fig. 1 | PhotoniX

Fig. 1

From: Wear-resistant surface coloring by ultrathin optical coatings

Fig. 1

Measured dielectric constant of TiAlN film (a) on a glass substrate, and TiN (c) on a silicon wafer. Re ε: real part of permittivity; Im ε: imaginary part of permittivity. Insets: photographs of 50-nm-TiAlN and 50-nm-TiN films on a glass and silicon substrate, respectively. b, absorption spectra of 50-nm-thick TiAlN (black curve), and 50-nm-thick a-Si (blue curve). d, Reflectance spectrum of 50-nm-TiN film sputtered on a silicon wafer at 300 \({~}^{\circ }\)C

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