Fig. 5

X-ray imaging of ZnO:Ga wafer. a Measurement schematic of the X-ray imaging. b Image of the test-pattern plate under X-ray excitation, showing a 4.5 lp/mm resolution ratio. c and (d) Photographs of integrity chip of iphone 6 s under X-ray radiation and white light. e and (f) Photographs of arcane beetle specimen and cicada specimen under white light and X-ray radiation. All the above-mentioned X-ray imaging patterns can display rich and clear details of the imaged objects