Fig. 7
From: Detection of surface defects and subsurface defects of polished optics with multisensor image fusion
Algorithm schematic diagrams for image registration and fusion. a Diagrams of feature points selection from two images to be registered (scattering image on the left, fluorescence image on the right). b Diagrams of affine transformation model. c Simulation images of three types of defects (scattering image on the left, fluorescence image on the right). d Diagrams of contour overlap judgment: i. coarse judgment; ii. fine judgment. e Results of image fusion: i. superposition image; ii. type I defects (SDs); iii. type II defects (covered SSDs); iv. Type III defects (extended SSDs)