Fig. 1
a-b Schematic illustration of the 3DMN prepared by the one-step ULPT. c SEM and d 3D images of the 3DMN. e TEM sample fabricated by the standard focused ion beam. f High angle annular darkfield (HAADF) image. EDS-mapping results of elements (g) Zn and (h) O. i HRTEM image of Zn/ZnO interface. HRTEM images of (j) Zn and (k) ZnO. The insets show corresponding SAED patterns of Zn[100] and ZnO[001]. l Contact angles of 2 M ZnSO4 aqueous electrolyte on the bare Zn and 3D-ULPT-Zn anodes. Scale bar: 10 μm for c (1 μm for the inset), 1 μm for e-h, 10 nm for i, and 1 nm for j-k (5 1/nm for the insets)