Fig. 3From: Chip-to-chip optical multimode communication with universal mode processorsVerification of chip-generated orthogonal modes. a The experimental setup for testing the modes generated by the trained mode generator. The SLM is used to demodulate the four orthogonal modes. A CCD is placed behind the SLM to capture the far-field interference pattern. b The far-field interference pattern of the demodulated LP and OAM modes (generated by the mode generator). The interference centers are marked with black circlesBack to article page